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Thin Film Analysis by X-Ray Scattering Techniques for Structural Characterization - 9783527310524

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₹9655
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About the Book :

  • Language : English
  • Binding : Hardcover
  • Contributors : Mario Birkholz, Paul F. Fewster, Christoph Genzel

Thin Film Analysis by X-Ray Scattering Techniques for Structural Characterization Details :

DETAILS

  • Language : English
  • Binding : Hardcover
  • Contributors : Mario Birkholz, Paul F. Fewster, Christoph Genzel
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Thin Film Analysis by X-Ray Scattering Techniques for Structural Characterization Price History

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Thin Film Analysis by X-Ray Scattering Techniques for Structural Characterization
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Other Books By Paul F Fewster :

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Thin Film Analysis by X-Ray Scattering Techniques for Structural Characterization
Thin Film Analysis by X-Ray Scattering Techniques for Structural Characterization
₹9655 onwards

Other Books By Christoph Genzel :

Thin Film Analysis by X-Ray Scattering Techniques for Structural Characterization
Thin Film Analysis by X-Ray Scattering Techniques for Structural Characterization
₹9655 onwards
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