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Thin Film Analysis by X-Ray Scattering Techniques for Structural Characterization - 9783527310524
Mario Birkholz , Paul F Fewster , Christoph GenzelAbout the Book :
- Language : English
- Binding : Hardcover
- Contributors : Mario Birkholz, Paul F. Fewster, Christoph Genzel
Thin Film Analysis by X-Ray Scattering Techniques for Structural Characterization Details :
DETAILS
- Language : English
- Binding : Hardcover
- Contributors : Mario Birkholz, Paul F. Fewster, Christoph Genzel
Thin Film Analysis by X-Ray Scattering Techniques for Structural Characterization Price History
- The best price for Thin Film Analysis by X-Ray Scattering Techniques for Structural Characterization in India is Rs. as per May 18, 2024, 6:07 pm
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