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Frontiers of Characterization and Metrology for Nanoelectronics 2007 International Conference on Frontiers of Characterization and Metrology for Nano 1st Edition - 9780735404410
R A Higgins , Raymond A Higgins
₹11304
About the Book :
- Language : English
- Binding : Hardcover
- Contributors : R. A. Higgins, Raymond A. Higgins
Frontiers of Characterization and Metrology for Nanoelectronics 2007 International Conference on Frontiers of Characterization and Metrology for Nano 1st Edition Details :
DETAILS
- Language : English
- Binding : Hardcover
- Contributors : R. A. Higgins, Raymond A. Higgins
Frontiers of Characterization and Metrology for Nanoelectronics 2007 International Conference on Frontiers of Characterization and Metrology for Nano 1st Edition Price History
- The best price for Frontiers of Characterization and Metrology for Nanoelectronics 2007 International Conference on Frontiers of Characterization and Metrology for Nano 1st Edition in India is Rs. as per December 23, 2024, 8:38 pm
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