Angewandte Oberflachenanalyse Mit Sims Sekundar-Ionen-Massenspektrometrie AES Auger-Elektronen-Spektrometrie XPS Rontgen-Photoelektronen-Spektrometrie German - 9783642701788
M GrasserbauerAbout the Book :
- Language : German
- Binding : Paperback
- Contributors : M. Grasserbauer, H. J. Dudek, Maria F. Ebel
Angewandte Oberflachenanalyse Mit Sims Sekundar-Ionen-Massenspektrometrie AES Auger-Elektronen-Spektrometrie XPS Rontgen-Photoelektronen-Spektrometrie German Details :
DETAILS
- Language : German
- Binding : Paperback
- Contributors : M. Grasserbauer, H. J. Dudek, Maria F. Ebel
Angewandte Oberflachenanalyse Mit Sims Sekundar-Ionen-Massenspektrometrie AES Auger-Elektronen-Spektrometrie XPS Rontgen-Photoelektronen-Spektrometrie German Price History
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